Վ. Ա. Վարդանյան
Թեստային հարցերի և խնդիրների շտեմարան
| Երևան, Ճարտարագետ, 2011:—306 էջ
Գիրք/Book
Vardanyan V.A., Bozoyan Sh.E., Simonyan S.H., Vardanyan R.R., Maranjyan H.B., Buniatyan V.V., Khudaverdyan S.Kh., Petrosyan S.G., Babayan A.H., Harutyunyan A.G., Travajyan M.G., Yeghiazaryan S.S., Gomtsyan H.A., Melikyan V.Sh., Movsisyan V.M., Muradyan M.A., Ayvazyan G.E., Melkonyan S.V., Minasyan A.K., Tumanyan A.K., Stepanyan H.L., Tananyan H.G.
I-IV Armenian Microelectronics Olympiad Tests and Problems
| SEUA, Yerevan, 2009.-218 P. (in Armenian)
Vardanyan V.A., Melikyan V.Sh., Movsisyan V.M., Bozoyan Sh.E., Simonyan S.H., Vardanyan R.R., Maranjyan H.B., Buniatyan V.V., Khudaverdyan S.Kh., Petrosyan S.G., Babayan A.H., Harutyunyan A.G., Travajyan M.G., Yeghiazaryan S.S., Gomtsyan H.A., Muradyan M.A., Ayvazyan G.E., Melkonyan S.V., Minasyan A.K., Tumanyan A.K., Stepanyan H.L.
I-III Armenian Microelectronics Olympiad Tests and Problems
| SEUA, Yerevan, 2008.-161 P. (in Armenian)
Հոդված/Article
Vrezh Sargsyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Avetik Yessayan
An efficient approach for memory repair by reducing the number of spares
| East-West Design & Test Symposium (EWDTS) Batumi, Georgia September 26-29, 2015, pp. 21-25 (english) | 
T. Grigoryan, H. Malkhasyan, G. Mushyan, V.Vardanian
Fault Collapsing For Digital Circuits Based On Relations Between Stuck-At Faults
| IEEE Proceedings "Computer Science and Informatio Technologies (CSIT)", USA, 2015, pp. 15-18 (English)
Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
Extending fault periodicity table for testing faults in memories under 20nm
| East-West Design & Test Symposium (EWDTS), Kiev, Ukraine September 26-29, 2014, pp. 5 - 9 (english)
Melkumyan T., Harutyunyan G., Shoukourian S., Vardanian V., Zorian Y.
“An Efficient Fault Diagnosis and Localization Algorithm for Successive-Approximation Analog to Digital Converters''
| Proc. IEEE East-West Design and Test Symposium, Kharkov National University of Radioelectronics, Kharkov, Ukraine, Sep. 14-17, 2012, pp. 15-18
G. Harutyunyan, S. Shoukourian, V. Vardanian, Y. Zorian
“A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs”
| IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), Volume 31, Number 6, June 2012, pp. 941-949
Արտոնագիր/Patent
Aram Hakhumyan, Gurgen Harutyunyan, Samvel Shoukourian, Valery Vardanian, Yervant Zorian
Testing electronic memories based on fault and test algorithm periodicity
| SYNOPSYS, INC. (Mountain View, CA). 9831000. Nov 28, 2017
Թեզիս/Thesis
Alexanyan K., Amirkhanyan K., Karapetyan S., Shoukourian S., Shubat A., Vardanian V., Zorian Y.
“Various methods and apparatuses for memory modeling using a structural primitive verification for memory compilers”
| US Patent No. 8,112,730, 2012
H. Grigoryan, G. Harutyunyan, S.Shoukourian, V. Vardanian, Y. Zorian
“Minimal Algorithms for Testing Content-Addressable Memories”
| In proc. of IEEE East-West Design & Test Symposium 2010, St. Petersburg, Russia, September 17-20, 2010
K. Aleksanyan, V.A. Vardanian
“Yield Improvement Based on Full Repair of SRAMs with Defective Redundancies”
| Proceedings of IEEE East-West Design & Test International Symposium, Yerevan, Armenia, 2007
T.A. Gjonjyan, J.T. Sargsyan, V. Vardanian
“Fast Generation of March Tests for Fault Detection and Diagnosis in Static Random Access Memories”
| Proceedings of IEEE East-West Design & Test International Symposium, Yerevan, Armenia, 2007
T. Gyonjyan, V. A. Vardanian
“An Efficient Algorithm for Generating Minimal March Tests for Fault Detection and Diagnosis in Static Random Access Memories”
| International Design and Test Workshop, Dubai, November 19-20, 2006
